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→Testing According to UL and CSA
Relevant experiments have shown that combined effects of synchronism, phase sequence and switching delay can, under severe adverse conditions,
lead to extreme damage, especially on at least one of the phases or poles. They are the cause of early failure of this phase and therefore the complete switching device and can happen as early as after only 30% of the normally expected lifetime. Because of variations in the mechanical characteristics of switching devices from manufacturing processes life testing cannot be performed on one device alone. Only statistical analysis of tests from multiple device samples can be used as reliable results. Such a procedure is however time consuming and costly. If however every single switching operation during a test is monitored for bounce behavior, on- and off-switching synchronization and related phase sequencing and phase delays, the arc moving behavior, and especially arc energy which is transferred during make and break arcing to the contact pieces, and then these data are properly analyzed, it is it possible to assess a specific contact material from a test in only one device alone. Only statistical analysis of tests from multiple device samples can be used as reliable results. Such a procedure is however time consuming and costly. If however every single switching operation during a test is monitored for bounce behavior, on- and offswitching synchronization and related phase sequencing and phase delays, the arc moving behavior, and especially arc energy which is transferred during make and break arcing to the contact pieces, and then these data are properly analyzed, is it possible to assess a specific contact material from a test in only one device.
====<!--13.4.2.4-->Switching Capacity====
The main requirement for low voltage power switches is the withstanding of high short circuit currents. The short circuit switching capacity of power switches is determined in tests according to IEC/EN 60947-2 (<xr id="tab:Testing for the Short Circuit Breaking Capacity of Low Voltage Power Switches According to IECEN 60947-2 (Shortened Summary)"/><!--(Tab. 13.3)-->). These test tests differentiate between the maximum short circuit current switching capacity (ultimate current limit) I<sub>CU</sub> and the operational (or service) short circuit current capacity I<sub>CS</sub> .
When specifying I<sub>CU</sub> it must be guaranteed that short circuit current up to the maximum limit value can be interrupted safely. After its occurrence it must be possible to switch on one additional time onto the not yet eliminated short circuit and again interrupt this short circuit current again safely. The switch does not have to be functional any more after this second interruption. A switch specified for I<sub>CS</sub> must still be capable to protect the circuit and be further usable within certain limitations.
===<!--13.4.3-->Testing According to UL and CSA===
The test standards for North America according to UL (USA) and CSA (Canada) differ in part substantially from those of the IEC and harmonized European EN standards. In the US and Canada the standards differentiate between switchgear for power distribution, for example low voltage circuit breakers and power switches covered by UL 489 (UL = Underwriters Laboratories) and CSAC22.2 No. 5-02 (CSA = Canadian Standard Association) and those for industrial switching devices, for example contactors covered by UL 508 and CSA-C22.2 No. 14 respectively. For industrial controls , contactors and other switching devices are often classified in the USA according to NEMA (National Electrical Manufacturers Association) current rating. North American standards emphasize the prevention of fires and therefore have has high limit requirements on temperature rise. They also require larger air and creep gaps than those of IEC, which leads to significant differences in the design of the switches and their contact systems.
==References==
